Inverse Multislice Ptychography by Layer-Wise Optimisation and Sparse Matrix Decomposition

We propose algorithms based on an optimisation method for inverse multislice ptychography in, e.g. electron microscopy. The is widely used to model the interaction between relativistic electrons and thick specimens. Since only intensity of diffraction patterns can be recorded, challenge in applying uniquely reconstruct electrostatic potential each slice up some ambiguities. In this conceptual study, we show that a unique separation atomic layers simulated data possible when considering low acceleration voltage. also introduce adaptation estimating illuminating probe. For sake practical application, finally present reconstructions using experimental 4D scanning transmission microscopy (STEM) data.